Imaging and Control of Domain Structures in Ferroelectric Thin Films via Scanning Force Microscopy1

نویسندگان

  • Alexei Gruverman
  • Orlando Auciello
  • Hiroshi Tokumoto
چکیده

Scanning force microscopy (SFM) is becoming a powerful technique with great potential both for imaging and for control of domain structures in ferroelectric materials at the nanometer scale. Application of SFM to visualization of domain structures in ferroelectric thin films is described. Imaging methods of ferroelectric domains are based on the detection of surface charges in the noncontact mode of SFM and on the measurement of the piezoelectric response of a ferroelectric film to an external field applied by the tip in the SFM contact mode. This latter mode can be used for nondestructive evaluation of local ferroelectric and piezoelectric 1The US Government has the right to retain a nonexclusive, royalty-free license in and to any copyright covering this paper.

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تاریخ انتشار 2001